We're Closer Than You Think
Istanbul
Hong Kong
Now Serving Africa, Europe and the Middle East through Our New Ultra-modern Istanbul QC Lab
Time is of the essence, and our QC labs are engineered to attest to that. Whether facing tight project schedules or immediate production demands, McKinsey Electronics ensures that your sourced components undergo thorough testing without causing unnecessary delays.
Operated by ERAI-certified quality control engineers and following AS6081 and AMD (Aerospace, Maritim and Defense) standards, our Quality Control Labs offer a wide range of tests and inspections.
Types of Tests
External Visual Inspection
The validity of the interior packaging, the humidity indicator, the desiccant requirements, and the suitability of the outside packaging are all confirmed through appearance testing. Additionally, the outward look of a single chip is examined, including the characters and data printed on the chip, such as the year, the country of origin, if it has been re-coated, the condition of the pins, and whether there are any signs of re-grinding or unidentified residues.
Heated Chemical Test
It will be possible to validate and establish through this testing process whether the device has been remarked or resurfaced. Many suppliers exploit slower speed or older date code devices as part of counterfeiting, then they repair them to look brand new and market them as higher-grade electronic components, with a more recent date code, or as RoHS compliant.
Heated Chemical Testing or HCT is mainly used to check for secondary coating. As such, the partially cured resins, paint, blacktop, or secondary coating will degrade if left for a predetermined amount of time. Then, a crisp image is captured under the microscope, to reveal any secondary coatings the device may have had. On a refurbished item, more things might be visible when the coating is removed during this process,
such as:
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Previous device markings
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Exposed sanding marks
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Marks of bead blasting
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Pin indicator
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Device remarking
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Speed grade rating change from C (Commercial) to I (Industrial)
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Masking signs of rips, chips, cracks, or other irregularities
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Uncovered bond wires
Solderability Test
In the electronics sector, the solderability test is carried out by replicating the welding process and assessing the sample's impact while analyzing the quality of the employed solder paste and flux as well as the soldering process. The purpose of the wetting balance is to quickly wet the sample while measuring the strength of the solder to determine how much force was applied and how long it took for the binding to take place.
The particular sample is put on the fixture and submerged in the solder at the predetermined temperature. To accurately and quantitatively assess the soldering quality, the force and time data are supplied to the computer via the sensor, and the curve and data file are produced via the program.
X-ray Inspection
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Examining the integrity of the bonding, layer peeling, void, and burst for integrated circuits (IC) packaging flaws
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Potential flaws in the printing of printed circuit boards (PCB), such as poor alignment, bridging, and open circuit
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Detection and measurement of the surface-mount technology (SMT) solder joint void phenomenon
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Inspection of flaws for possible open circuits, short circuits, or irregular connections in various connecting lines
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Solder ball array packing and chip-on-chip packaging integrity inspection
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Examining plastic materials with higher densities or metal materials with holes
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Measurement of component tin area ratio, wire arc, and chip size
Decapsulation Test
Decapsulation and high magnification analysis are additional tools that McKinsey Electronics utilizes to look for damage on ICs surface, as well as to determine the authenticity and traceability of the DUT. The objective of this operation is to check if the die has been reassembled or repackaged or to see if physical damage or excessive stress caused a functional failure.
Decapsulation is the process of mechanically, thermally, or chemically removing a cap, lid, or encapsulating material from a packed integrated circuit. To enable additional examination, decapsulation is done to get access to a device's package cavity and/or surface. The removal of the lid in the case of a hermetic device enables visual inspection for foreign objects, corrosion, or mechanical harm. The IC surface is also visible when the polymeric encapsulating substance covering the plastic-packaged part is removed.
Functionality Test